Apertureless Near-field Probe Design with Correlation to Field Enhancement and Focal Delocalization
نویسندگان
چکیده
منابع مشابه
Field enhancement in apertureless near-field scanning optical microscopy.
The near field of an apertureless near-field scanning optical microscopy probe is investigated with a multiple-multipole technique to obtain optical fields in the vicinity of a silicon probe tip and a glass substrate. The results demonstrate that electric field enhancements of >15 relative to the incident fields can be achieved near a silicon tip, implying intensity enhancements of several orde...
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Near-field two-photon optical lithography is demonstrated by using ;120 fs laser pulses at 790 nm in an apertureless near-field optical microscope, which produces lithographic features with ;70 nm resolution. The technique takes advantage of the field enhancement at the extremity of a metallic probe to induce nanoscale two-photon absorption and polymerization in a commercial photoresist, SU-8. ...
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Near-field multiphoton optical lithography is demonstrated by using ~120 fs laser pulses at 790 nm in an apertureless near-field optical microscope, which produce the lithographic features with ~ 70 nm resolution. The technique takes advantage of the field enhancement at the extremity of a metallic probe to induce nanoscale multiphoton absorption and polymerization in a commercial photoresist, ...
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We demonstrate a new method whereby near-field optical microscope resolution can be extended to the nanometer regime. The technique is based on measuring the modulation of the scattered electric field from the end of a sharp silicon tip as it is stabilized and scanned in close proximity to a sample surface. Our initial results demonstrate resolution in the 3 nm range--comparable to what can be ...
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Non-destructive detection and evaluation of invisible cracks in metal structures is an important matter in several critical environments including ground transportation, air transportation and power plants. In this paper, a high-Q near-field Microwave probe is designed and fabricated using defected ground structures for surface and subsurface crack detection in metal structures. For this purpos...
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ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2011
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927611001000